Fault grading
From Infogalactic: the planetary knowledge core
Fault grading is a procedure that rates testability by relating the number of fabrication defects that can in fact be detected with a test vector set under consideration to the total number of conceivable faults.
It is used for refining both the test circuitry and the test patterns iteratively, until a satisfactory fault coverage is obtained.[1]
See also
References
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